nanoandmore/ARROW-CONTR/ARROW-CONTR-50/Box of 50 AFM Probes
Cantilever:
F: 14 kHz C: 0.2 N/m L: 450 µmApplications:
Contact Mode AFM ProbesDescription:
Optimized positioning through maximized tip visibilityNanoWorld Arrow™ CONT probes are designed for Contact Mode imaging. Furthermore this type can be used for Force Distance Spectroscopy Mode or Pulsed Force Mode (PFM). The CONT type is optimized for high sensitivity due to a low Force Constant.All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip with. Additionally, this probe offers an excellent tip radius of curvature.The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.
Aluminum Reflex CoatingThe aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.As the coating is almost stress-free the bending of the cantilever due to stress is less than 2 degrees.AFM Tip:
AFM Cantilever:
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