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nanoandmore/ElectriTap150-G/Tap150E-G-10/Box of 10 AFM Probes
2025-05-10
Cantilever:
F: 150 kHz C: 5 N/m L: 125 µmApplications:
Conductive AFM ProbesDescription:
Monolithic silicon AFM probe for soft tapping mode operation, and electric modes such as:
- scanning capacitance microscopy (SCM)
- electrostatic force microscopy (EFM)
- Kelvin probe force microscopy (KFM)
The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.
The AFM holder chip fits most commercial AFM systems as it is industry standard size. It is compatible with:
- Bruker / Veeco / Digital Instruments
- Keysight / Agilent / Molecular Imaging
- Asylum Research
- Park Systems
- JEOL
- JPK
- etc.
Consistent high quality at a lower price!
Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.AFM Tip:
AFM Cantilever:
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