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nanoandmore/Arrow-FM/ARROW-FM-20/Box of 20 AFM Probes

  
  2024-04-29
  

Cantilever:

F: 75 kHz C: 2.8 N/m L: 240 µm

Applications:

Force Modulation (FM) AFM ProbesNon-Contact / Soft Tapping Mode AFM Probes

Description:

Optimized positioning through maximized tip visibilityNanoWorld Arrow™ FM probes are designed for Force Modulation Mode imaging. The Force Constant of the FM type fills the gap between Contact and Non-Contact probes. Furthermore Non-Contact / TappingMode™ imaging is possible with this AFM probe.All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip.Additionally, this probe offers an excellent tip radius of curvature.The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.

Uncoated

AFM Tip:

  • shape: Arrow
  • height: 10 - 15 µm
  • radius:
  • AFM Cantilever:

  • shape: Beam
  • length: 240 µm (235 - 245 µm)*
  • width: 35 µm (30 - 40 µm)*
  • thickness: 3 µm (2.5 - 3.5 µm)*
  • force constant: 2.8 N/m (1.4 - 5.8 N/m)*
  • resonance frequency: 75 kHz (58 - 97 kHz)*
  • * typical range

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