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nanoandmore/AR10-NCHR/AR10-NCHR-10/Box of 10 AFM Probes
2025-06-26
Cantilever:
F: 330 kHz C: 42 N/m L: 125 µmApplications:
High Aspect Ratio (HAR) AFM ProbesDescription:
NANOSENSORS™ AR10-NCHR AFM tips are designed for non-contact or tapping mode AFM. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
For measurements on samples with sidewall angles approaching 90° NANOSENSORS™ produces specially tailored tips. These tips are FIB (Focused Ion Beam) milled to achieve a high aspect ratio portion better than 10:1 at the end of the common silicon tip. This subtractive method of producing the high aspect ratio needle offers the advantage of high lateral stiffness and rigidity of the tip.
The probe offers unique features:
- length of the high aspect ratio portion of the tip > 1.5 µm
- typical aspect ratio at 1.5 µm in the order of 12:1 (when viewed from side as well as along cantilever axis)
- excellent tip radius of curvature
- highly doped silicon to dissipate static charge
- high mechanical Q-factor for high sensitivity
AFM Tip:
AFM Cantilever:
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